Journal
APPLIED PHYSICS LETTERS
Volume 105, Issue 1, Pages -Publisher
AIP Publishing
DOI: 10.1063/1.4890156
Keywords
-
Categories
Funding
- National Science Council of Taiwan [NSC 101-2628-E-007-018-MY2]
- Industrial Technology Research Institute
Ask authors/readers for more resources
An experimental method for measuring thermal boundary resistances of thermoelectrics/metal interfaces using two specially designed multilayer structures is presented. The thermal boundary resistances of Bi0.4Sb1.6Te3 thin films in contact with respective Ni and Ti metal layers are experimentally determined to be 2.65 +/- 0.98 x 10(-8) and 2.85 +/- 1.06 x 10(-8) m(2)K/W. The results agree reasonably well with the predictions from the diffusive mismatch model for Bi0.4Sb1.6Te3/ metal interfaces. The effect of phonon transport property of metals on thermal boundary resistance at thermoelectrics/metal interfaces is investigated. (C) 2014 AIP Publishing LLC.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available