Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4788709
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Funding
- Danish council for independent research (natural sciences and technology and production sciences)
- European research council (ERC consolidator Grant ALLQUANTUM)
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Residual disorder due to fabrication imperfections has important impact in nanophotonics where it may degrade device performance by increasing radiation loss or spontaneously trap light by Anderson localization. We propose and demonstrate experimentally a method of quantifying the intrinsic amount of disorder in state-of-the-art photonic-crystal waveguides from far-field measurements of the Anderson-localized modes. This is achieved by comparing the spectral range where Anderson localization is observed to numerical simulations, and the method offers sensitivity down to similar or equal to 1nm. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4788709]
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