Journal
APPLIED PHYSICS LETTERS
Volume 103, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4816162
Keywords
-
Categories
Funding
- PrivaTran LLC [N66001-11-C-5212]
- Div Of Industrial Innovation & Partnersh
- Directorate For Engineering [1127537] Funding Source: National Science Foundation
Ask authors/readers for more resources
The ambient gas effect in SiOx-based resistive switching memory has been studied. After the electroforming process, resistive switching behavior functions in vacuum as well as in nitrogen without dramatic degradation. However, introducing an oxygen-nitrogen ambient suppresses resistive switching behavior at pressures above 1 Torr. Resistive switching is fully reestablished in oxygen-exposed devices after a vacuum recovery step. The failure phenomena can be described by Monte Carlo simulation using bi-modal statistics to enable feature distribution modeling of failure modes. Design criteria and guidelines are identified for packaging of future oxygen-sensor and of nonvolatile memory applications. (C) 2013 AIP Publishing LLC.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available