4.6 Article

Large area single crystal (0001) oriented MoS2

Journal

APPLIED PHYSICS LETTERS
Volume 102, Issue 25, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4811410

Keywords

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Funding

  1. NSF NSEC (CANPD) Program [EEC0914790]
  2. NSF ECCS [ECCS-0925529]
  3. NSF [ECCS0824170, CMMI0928888, DMR-0955471]
  4. OSU NSF MRSEC CEM Seed Program
  5. WCU program at GIST through a MEST (Korea)
  6. Direct For Mathematical & Physical Scien
  7. Division Of Materials Research [1055164] Funding Source: National Science Foundation
  8. Div Of Electrical, Commun & Cyber Sys
  9. Directorate For Engineering [0925529] Funding Source: National Science Foundation

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Layered metal dichalcogenide materials are a family of semiconductors with a wide range of energy band gaps and properties, the potential for exciting physics and technology applications. However, obtaining high crystal quality thin films over a large area remains a challenge. Here we show that chemical vapor deposition (CVD) can be used to achieve large area single crystal Molybdenum Disulfide (MoS2) thin films. Growth temperature and choice of substrate were found to critically impact the quality of film grown, and high temperature growth on (0001) oriented sapphire yielded highly oriented single crystal MoS2 films. Films grown under optimal conditions were found to be of high structural quality from high-resolution X-ray diffraction, transmission electron microscopy, and Raman measurements, approaching the quality of reference geological MoS2. Photoluminescence and electrical measurements confirmed the growth of optically active MoS2 with a low background carrier concentration, and high mobility. The CVD method reported here for the growth of high quality MoS2 thin films paves the way towards growth of a variety of layered 2D chalcogenide semiconductors and their heterostructures. (C) 2013 AIP Publishing LLC.

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