Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4773565
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We report on the growth, fabrication, and device characterization of AlGaN-based thin-film ultraviolet (UV) (lambda similar to 359 nm) light emitting diodes (LEDs). First, AlN/Si(111) template is patterned. Then, a fully coalesced 7-mu m-thick lateral epitaxial overgrowth (LEO) of AlN layer is realized on patterned AlN/Si(111) template followed by UV LED epi-regrowth. Metalorganic chemical vapor deposition is employed to optimize LEO AlN and UV LED epitaxy. Back-emission UV LEDs are fabricated and flip-chip bonded to AlN heat sinks followed by Si(111) substrate removal. A peak pulsed power and slope efficiency of similar to 0.6 mW and similar to 1.3 mu W/mA are demonstrated from these thin-film UV LEDs, respectively. For comparison, top-emission UV LEDs are fabricated and back-emission LEDs are shown to extract 50% more light than top-emission ones. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4773565]
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