4.7 Article

Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)

Journal

SCRIPTA MATERIALIA
Volume 51, Issue 8, Pages 771-776

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2004.05.016

Keywords

EBSD; FEGSEM; grain boundaries; ECAE; cold working

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Recent developments in instrumentation and software now enable grain structures >0.1 mum to be quantitatively characterised by EBSD in conjunction with a field emission gun scanning electron microscope. The paper discusses the advantages and limitations of the technique. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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