4.6 Article

High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

Journal

APPLIED PHYSICS LETTERS
Volume 102, Issue 9, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4794063

Keywords

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Funding

  1. Core Research for Evolutional Science and Technology
  2. Global COE Program Center of Excellence for Atomically Controlled Fabrication Technology
  3. Ministry of Education, Culture, Sports, Science and Technology
  4. [24651137]
  5. [23102504]
  6. Grants-in-Aid for Scientific Research [23102504] Funding Source: KAKEN

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We demonstrate high-resolution and high-sensitivity x-ray phase-contrast imaging of a weakly scattering extended object by scanning coherent diffractive imaging, i.e., ptychography, using a focused x-ray beam with a spatial filter. We develop the x-ray illumination optics installed with the spatial filter to collect coherent diffraction patterns with a high signal-to-noise ratio. We quantitatively visualize the object with a slight phase shift (similar to lambda/320) at spatial resolution better than 17 nm in a field of view larger than similar to 2 x 2 mu m(2). The present coherent method has a marked potential for high-resolution and wide-field-of-view observation of weakly scattering objects such as biological soft tissues. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4794063]

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