Electrically driven quantum dot single-photon source at 2 GHz excitation repetition rate with ultra-low emission time jitter

The influence of the bias voltage on emission properties of a red emitting InP/GaInP quantum dot based single-photon source was investigated. Under pulsed electrical excitation, we can influence the band bending of the p-i-n diode with the applied bias voltage and thus the charge carrier escape by quantum tunneling. This leads to control over the non-radiative decay channel and allows carrier escape times as low as 40 ps, effectively reducing the time jitter of the photon emission. We realized high excitation repetition rates of up to 2GHz while autocorrelation measurements with g((2))(0)-values of 0.27 attest dominant single-photon emission. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4774392]