Journal
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 39, Issue 10, Pages 1764-1772Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2004.833766
Keywords
bipolar transistor; electrothermal modeling; self-heating; silicon-on-glass; thermal coupling; thermal impedance
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A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction of the small-signal thermal impedance network of bipolar devices and circuits. The extraction procedure is demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling of the mutual thermal coupling obtained by fitting a multipole rational complex function to measured data is presented.
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