4.6 Article

Direct evidence for stress-induced (001) anisotropy of rapid-annealed FePt thin films

Journal

APPLIED PHYSICS LETTERS
Volume 100, Issue 26, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4730963

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Funding

  1. National Science Council of Taiwan [NSC99-2632-E-035-001-MY3, NSC101-3113-E-035-001, NSC99-2221-E-213-002-MY3]

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Roles of rapid thermal annealing (RTA) on the evolution of crystallographic anisotropy of single-layered FePt films have been characterized. We observed a huge biaxial tensile stress of 2.18 GPa induced with increasing heating rate from 0.5 to 40 K/s. The result is a transition of orientation from (111) to perfect (001) texture. The later then degrades at heating rates >= 80 K/s due to morphological variation. The advantages of RTA are to induce tensile stress by densification reaction within a very short time and to simultaneously impede thickness-dependent dynamic stress relaxation. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4730963]

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