4.6 Article

Control of Schottky barrier heights by inserting thin dielectric layers

Journal

APPLIED PHYSICS LETTERS
Volume 101, Issue 17, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4764521

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Funding

  1. EPSRC [EP/J011592/1] Funding Source: UKRI
  2. Engineering and Physical Sciences Research Council [EP/J011592/1] Funding Source: researchfish

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The insertion of ultra-thin dielectric layers to lower n-type Schottky barrier heights is shown to partly involve the creation of a net interfacial dipole as well as unpinning of the Fermi level by suppression of metal-induced gap states. The existence of a net dipole requires a lack of cancellation of dipoles at the two interfaces. This requires a different metal(Ge)-O bond density at the two interfaces, in general requiring differing oxygen chemical potentials. This would need the inserted dielectric to be a diffusion barrier, not just able to create dipoles, favoring the use of Al2O3-based or nitrided dielectrics. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764521]

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