Journal
APPLIED PHYSICS LETTERS
Volume 101, Issue 15, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4758699
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Funding
- Marie Curie Intra European Fellowship within the 7th European Community Framework Programme the European Union (IonBeatHeteroMat) [PIEF-GA-2010-274999]
- Engineering and Physical Sciences Research Council [EP/H006060/1] Funding Source: researchfish
- EPSRC [EP/H006060/1] Funding Source: UKRI
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Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He+ scattered by O-18-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E-i<0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E-i>2 keV. The ion fractions P+ were determined for Si and O using the characteristic velocity method to quantify the surface density. The O-18/O-16 sensitivity ratio indicates an 18% higher sensitivity for the heavier O isotope. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4758699]
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