Journal
APPLIED PHYSICS LETTERS
Volume 100, Issue 8, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3688175
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Funding
- Army Research Office [W911NF-10-1-0482]
- Samsung Electronics Co., Ltd. [919 Samsung 2010-06795]
- U.S. Department of Energy [DE-FG02-07ER46453, DE-FG02-07ER46471]
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Chemical-alloying is demonstrated to stabilize the mixed-phase structure of highly strained epitaxial BiFeO3/LaAlO3 (001) heterostructures. Such mixed-phase structures are essential for the large electromechanical responses (4%-5% strains under applied electric field); however, films with thickness exceeding 250nm undergo an epitaxial breakdown to a non-epitaxial bulk-like rhombohedral-phase. Such an irreversible transformation of the mixed-phase structure limits the magnitude of the net surface displacement associated with these field-induced phase transformations. Using high-resolution x-ray diffraction reciprocal space mapping and scanning-probe-based studies, we show that chemical-alloying of BiFeO3 thin films can stabilize these mixed-phase structures and delay the onset of epitaxial breakdown. (C) 2012 American Institute of Physics. [doi:10.1063/1.3688175]
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