Journal
APPLIED PHYSICS LETTERS
Volume 101, Issue 19, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4766178
Keywords
antennas; infrared spectra; infrared spectroscopy; near-field scanning optical microscopy; polymers
Categories
Funding
- Excellence Initiative of the German Federal Government
- Excellence Initiative of the German State Government
- Ministry of Innovation, Science, Research and Technology of the German State of North Rhine-Westphalia
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Scattering-type scanning near-field optical microscopy (s-SNOM) allows for optical nanoscale imaging and provides information about topographical and chemical material properties with subwavelength resolution. In this letter, we demonstrate that the sensitivity of s-SNOM can be improved by means of infrared resonant antennas. This technique is comparable to the application of resonant nanostructures in far-field surface-enhanced infrared spectroscopy. We find that the near-field amplitude spectra of the polymer poly(ethyl methacrylate) obtained on resonant structures are increased in absolute value as well as in contrast over those obtained on non-resonant, highly reflective materials such as gold. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4766178]
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