Journal
APPLIED PHYSICS LETTERS
Volume 100, Issue 12, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3694754
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Funding
- WCU (World Class University) [R-31-2008-000-10055-0, KRF-2010-0005390, KRF-2011-0015387]
- SRC Centre for Topological Matter through the National Research Foundation (NRF) of Korea [2011-0030787]
- Ministry of Education, Science and Technology (MEST) of Korea
- School of Electrical Engineering at the University of Ulsan
- Ajou University
- National Research Foundation of Korea [2011-0030787] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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We report that a nanojunction composed of graphene, copper oxide, and Cu substrate exhibits resistive switching behavior, revealed with conductive probe atomic force microscopy at ultrahigh vacuum. The current-voltage curve measured between the titanium nitride-coated tip and the nanojunction exhibited reversible bistable resistance states. We propose that the switching behavior is controlled by the migration of oxygen ions in the copper oxide layer, leading to the reversible formation/disruption of a CuOx-associated charge tunneling barrier, which is consistent with glancing-angle x-ray photoelectron spectroscopy analysis. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3694754]
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