Structural and thermoelectric properties in (Sb1-xBix)2Te3 thin films

We have investigated the structural and thermoelectric properties of (Sb1-xBix)(2)Te-3 thin films on CdTe(111)B. Analysis of X-ray diffraction patterns (theta-2theta scans and rocking curves) of the films shows that they are of high quality and that they are well aligned with their (00.1) axis normal to the substrates. Measurements of the temperature-dependent thermoelectric power, resistivity, and Hall coefficient of the films were performed with respect to the binary composition, x. For the samples in the range 0.2<0.3, the room-temperature thermopower values were in the range 159-184 muV/K, the room-temperature carrier concentrations were 3.93-5.13x10(19) cm(-3), and the room-temperature mobilities were 24.6-64.0 cm(2) V-1 s(-1).