4.6 Article

Beyond the Nernst-limit with dual-gate ZnO ion-sensitive field-effect transistors

Journal

APPLIED PHYSICS LETTERS
Volume 98, Issue 4, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3546169

Keywords

-

Funding

  1. Dutch Polymer Institute [624]
  2. European project ONE-P [212311]

Ask authors/readers for more resources

The sensitivity of conventional ion-sensitive field-effect transistors (ISFETs) is limited to 59 mV/pH, which is the maximum detectable change in electrochemical potential according to the Nernst equation. Here we demonstrate a transducer based on a ZnO dual-gate field-effect transistor that breaches this boundary. To enhance the response to the pH of the electrolyte, a self-assembled monolayer has been used as a top gate dielectric. The sensitivity scales linearly with the ratio between the top and bottom gate capacitances. The sensitivity of our ZnO ISFET of 22 mV/pH is enhanced by more than two orders of magnitude up to 2.25 V/pH. (C) 2011 American Institute of Physics. [doi:10.1063/1.3546169]

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available