Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 21, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3663866
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Funding
- U.S. Department of Energy, Office of Basic Energy Sciences [DE-AC02-98CH10886]
- Ministerio de Educacion y Ciencia [CSD 2007-00010, FIS2010-18847]
- Comunidad de Madrid [S2009/MAT-1726]
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We report a He and H(2) diffraction study of graphene-terminated Ru(0001) thin films grown epitaxially on c-axis sapphire. Even for samples exposed for several weeks to ambient conditions, brief annealing in ultrahigh vacuum restored extraordinarily high specular reflectivities for He and H(2) beams (23% and 7% of the incident beam, respectively). The quality of the angular distributions recorded with both probes exceeds the one obtained from in-situ prepared graphene on Ru( 0001) single crystals. Our results for graphene-terminated Ru thin films represent a significant step toward ambient tolerant, high-reflectivity curved surface mirrors for He-atom microscopy. (C) 2011 American Institute of Physics. [doi:10.1063/1.3663866]
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