Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 22, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3579993
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Funding
- U.S. Department of Energy, Office of Basic Energy Sciences [DE-FG02-07-ER-4645, DE-SC0001009]
- U.S. Department of Energy [DE-FG02-07ER46453, DE-FG02-07ER46471]
- Division of Materials Sciences and Engineering of U. S. Department of Energy [DE-AC02-05CH1123]
- Link Energy Fellowship
- Dutch Organization for Scientic Research (NWO)
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Measurements of thermal conductivity Lambda by time-domain thermoreflectance in the temperature range 100 < T < 300 K are used to characterize the crystalline quality of epitaxial layers of a prototypical oxide, SrTiO3. Twenty samples from five institutions using two growth techniques, molecular beam epitaxy and pulsed laser deposition (PLD), were analyzed. Optimized growth conditions produce layers with Lambda comparable to bulk single crystals. Many PLD layers, particularly those that use ceramics as the target material, show surprisingly low Lambda. For homoepitaxial layers, the decrease in Lambda created by point defects correlates well with the expansion of the lattice parameter in the direction normal to the surface. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3579993]
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