Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3609317
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Funding
- Ministry of Education, Science and Technology (MEST) of Korea [R-31-2008-000-10055-0, KRF-2010-0005390, KRF-2011-0015387]
- MEST [R01-2008-000-20020-0, R31-2008-000-10059-0]
- Ministry of Education, Science & Technology (MoST), Republic of Korea [R31-2008-000-10059-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
- National Research Foundation of Korea [R01-2008-000-20020-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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The correlation between charge transport and mechanical deformation of the single layer graphene layer was studied with conductive probe atomic force microscopy/friction force microscopy in ultra-high vacuum. By measuring the current and friction on a graphene layer that is under mechanical stress, we identify crossover of two regimes in the current density that depend on the applied pressure. We suggest that the difference in work function under mechanical deformation as well as a change in the density of state and formation of a dipole field are responsible for this crossover behavior. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3609317]
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