Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 24, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3600642
Keywords
-
Categories
Funding
- DOE, Office of Basic Energy Sciences
- Los Alamos National Laboratory under DOE [DE-AC52-06NA25396]
- LANL-LDRD
Ask authors/readers for more resources
Neutron reflectometry is used to characterize physical vapor deposited [Cu/Nb](x)/Si layered nanocomposites exposed to extreme helium ion doses. The effects of He ions on the interfacial roughness, layer swelling, and chemical mixing have been measured. Regions of high He concentration were localized at Cu/Nb interfaces while bulk Cu and Nb layers remained intact. This remarkable behavior is attributed to the efficient trapping and storage of He at interfaces as compared to bulk. (C) 2011 American Institute of Physics. [doi:10.1063/1.3600642]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available