Related references
Note: Only part of the references are listed.An accurate high-speed single-electron quantum dot pump
S. P. Giblin et al.
NEW JOURNAL OF PHYSICS (2010)
Electrostatically defined few-electron double quantum dot in silicon
W. H. Lim et al.
APPLIED PHYSICS LETTERS (2009)
Application of the Josephson effect in electrical metrology
B. Jeanneret et al.
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS (2009)
Determination of the elementary charge and the quantum metrological triangle experiment
N. Feltin et al.
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS (2009)
Resistance metrology based on the quantum Hall effect
W. Poirier et al.
EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS (2009)
Nanoampere charge pump by single-electron ratchet using silicon nanowire metal-oxide-semiconductor field-effect transistor
Akira Fujiwara et al.
APPLIED PHYSICS LETTERS (2008)
Hybrid single-electron transistor as a source of quantized electric current
Jukka R. Pekola et al.
NATURE PHYSICS (2008)
Single electron pumping in InAs nanowire double quantum dots
A. Fuhrer et al.
APPLIED PHYSICS LETTERS (2007)
Gate-defined quantum dots in intrinsic silicon
Susan J. Angus et al.
NANO LETTERS (2007)
Gigahertz quantized charge pumping
M. D. Blumenthal et al.
NATURE PHYSICS (2007)
Manipulation and detection of single electrons for future information processing
Y Ono et al.
JOURNAL OF APPLIED PHYSICS (2005)
Share Paper
