Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 21, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3593138
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Funding
- National Security Science and Engineering Faculty Fellowship
- CNMS [CNMS2010-090]
- Oak Ridge National Laboratory by the Office of Basic Energy Sciences, U. S. Department of Energy [DE-AC05-00OR22725]
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Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3593138]
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