Related references
Note: Only part of the references are listed.Determination of polarization field in a semipolar (1122) InGaN/GaN single quantum well using Franz-Keldysh oscillations in electroreflectance
H. Shen et al.
APPLIED PHYSICS LETTERS (2009)
Unambiguous evidence of the existence of polarization field crossover in a semipolar InGaN/GaN single quantum well
H. Shen et al.
APPLIED PHYSICS LETTERS (2009)
A System for Simulation of Tip Evolution Under Field Evaporation
B. P. Geiser et al.
MICROSCOPY AND MICROANALYSIS (2009)
Nonpolar and Semipolar Group III Nitride-Based Materials
J. S. Speck et al.
MRS BULLETIN (2009)
Three-dimensional atom probe analysis of green- and blue-emitting InxGa1-xN/GaN multiple quantum well structures
M. J. Galtrey et al.
JOURNAL OF APPLIED PHYSICS (2008)
Specimen Preparation for Cross-Section Atom Probe Analysis
D Lawrence et al.
MICROSCOPY AND MICROANALYSIS (2008)
Diffusion of TaN and HfO into TiN in a Metal Gate Stack
D Reinhard et al.
MICROSCOPY AND MICROANALYSIS (2008)
Quantitative binomial distribution analyses of nanoscale like-solute atom clustering and segregation in atom probe tomography data
Michael P. Moody et al.
MICROSCOPY RESEARCH AND TECHNIQUE (2008)
Advances in pulsed-laser atom probe: Instrument and specimen design for optimum performance
Joseph H. Bunton et al.
MICROSCOPY AND MICROANALYSIS (2007)
Improved electroluminescence on nonpolar m-plane InGaN/GaN quantum wells LEDs
Kwang-Choong Kim et al.
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS (2007)
In situ site-specific specimen preparation for atom probe tomography
K. Thompson et al.
ULTRAMICROSCOPY (2007)
Strain-induced polarization in wurtzite III-nitride semipolar layers
A. E. Romanov et al.
JOURNAL OF APPLIED PHYSICS (2006)
Three-dimensional nanoscale composition mapping of semiconductor nanowires
DE Perea et al.
NANO LETTERS (2006)
Optical and microstructural studies of InGaN/GaN single-quantum-well structures
DM Graham et al.
JOURNAL OF APPLIED PHYSICS (2005)
Share Paper
