4.5 Article

Instrumentation for analysis and utilization of extreme-ultraviolet and soft x-ray high-order harmonics

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 75, Issue 11, Pages 4413-4418

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.1784563

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The design and the performances of an extreme ultraviolet (EUV)spectrometer/monochromator for generation and diagnostics of high-order harmonics of an ultrashort (<30 fs) pulsed laser focused onto a gas jet are presented. The harmonic generation is optimized using an adaptive mirror before the laser focusing stage. A toroidal mirror is used to focus the XUV radiation in an intermediate stage for pump/probe experiments. A grazing-incidence flat-field spectrometer for the 5-75 nm spectral region has been designed: it adopts a stigmatic toroidal mirror and a varied line-space flat grating mounted in converging light. The almost flat stigmatic spectrum is acquired by a 40-mm-diameter microchannel plate intensifier; the whole detector can be moved to scan various portions of the spectrum. Different detectors allow one to acquire both integrated and single shot spectra at 1 kHz repetition rate. The absolute calibration of the spectrometer is provided. The same optical scheme can be applied to the design of a constant deviation angle EUV monochromator by substituting the detector block with an exit slit. (C) 2004 American Institute of Physics.

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