Journal
APPLIED PHYSICS LETTERS
Volume 99, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3634028
Keywords
dielectric depolarisation; dislocations; elasticity; electric domains; epitaxial layers; ferroelectric materials; ferroelectric thin films; lead compounds; transmission electron microscopy
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Funding
- U.S. Department of Energy, Office of Basic Energy Sciences [DE-AC02-98CH10886]
- NSF [DMR 0520495 (CRISP), DMR 1006256]
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We describe a transmission-electron-microscopy study of the ferroelectric domains in an epitaxial Pb(Zr0.2Ti0.8)O-3 (PZT) film grown on La0.7Sr0.3MnO3/SrTiO3(001). We directly observe the pinning of 90 degrees domain walls by pairs of misfit dislocations, respectively, with Burgers vectors a [100] and a [001]. Model calculations based on the elastic theory confirm our finding that, in addition to the depolarization field surrounding the dislocation, the strain field of misfit dislocation-pairs plays the primary role in the formation and pinning of a domains. (C) 2011 American Institute of Physics. [doi:10.1063/1.3634028]
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