Metal-insulator transition without structural phase transition in V2O5 film

Spectroscopic ellipsometry and x-ray diffraction are used to investigate the metal-insulator transition in V2O5 films. Below and above T-c no significant change in the (001) peak is observed, but both n and k spectra undergo remarkable changes over the entire photon energy range. The SE and XRD results indicate that the V2O5 film undergoes a MIT without a structural phase transition near 280 degrees C. Further the MIT is confirmed by measurement of the resistance with temperature. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3571557]