Journal
PHYSICAL REVIEW E
Volume 70, Issue 5, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevE.70.051603
Keywords
-
Categories
Funding
- NIGMS NIH HHS [GM 55876] Funding Source: Medline
Ask authors/readers for more resources
Resonant x-ray reflectivity exploits the energy dependence of atomic scattering factors to locate resonant atoms within the electron density distribution of thin films. We apply the technique to a monolayer of bromostearic acid at the air/water interface. The data collection protocol employed cycles through several energies in the vicinity of the bromine K absorption edge and verifies that the energy dependencies observed are indeed resonant effects. The analysis specifies the location of the Br atom with sub-angstrom precision and must consider both the real and imaginary parts of the changes in the scattering factor to be consistent with the known structure and stoichiometry of this test case.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available