Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 2, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3462317
Keywords
crystal orientation; electronic density of states; elemental semiconductors; nanowires; piezoresistance; semiconductor quantum wires; silicon; surface states
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Funding
- Science Foundation Ireland (SFI) [03/CE3/M406s1]
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We investigate the morphological, electrical, and optical properties of carbon nanotube thin films, focusing on films with transmittance, T > 90%. For films with T approximate to 90% we measure sheet resistance of R(s)<400 Omega/square. However, we show that optoelectrical properties, such as sigma(dc) and sigma(dc)/sigma(Op), degrade with decreasing film thickness, t, for percolating nanotube networks, i.e., those with t < 20 nm and T > 90%. Thus, while reducing t can give T > 99%, the corresponding Rs increases to > 40 k Omega/square. Acid treatment improves the conductivity by doping, giving properties such as T approximate to 98% for R(s) approximate to 10 k Omega/square. (C) 2010 American Institute of Physics. [doi:10.1063/1.3462317]
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