4.3 Article Proceedings Paper

Control of valence band offset at CdS/Cu(In,Ga)Se2 interface by inserting wide-bandgap materials for suppression of interfacial recombination in Cu(In,Ga)Se2 solar cells

Journal

JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 54, Issue 8, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.7567/JJAP.54.08KC08

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Funding

  1. New Energy and Industrial Technology Development Organization (NEDO) under the Ministry of Economy, Trade and Industry

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We inserted Cu(In,Ga)(3)Se-5 into the CdS/Cu(In,Ga)Se-2 interface of Cu(In,Ga)Se-2 solar cells with a flat band profile and energy bandgaps (E-g) of 1.2 and 1.4 eV in order to investigate the repelling of holes by the effect of valence band offset (Delta E-v). We found that open circuit voltage (V-OC) was clearly improved from 0.66 to 0.75V with E-g of 1.4 eV, although V-OC was only increased from 0.63 to 0.64 V with E-g of 1.2 eV. For high efficiency, we fabricated Cu(In,Ga)Se-2 solar cells with a single-graded band profile and an average E-g of 1.4 eV. Eventually, a conversion efficiency of 14.4% was obtained when Cu(In,Ga)(3)Se-5 with a thickness of 30 nm was inserted, although the conversion efficiency was 10.5% without Cu(In,Ga)(3)Se-5. These results suggest the importance of Delta E-v in the suppression of interfacial recombination by repelling holes and possibility that the highest efficiency of Cu(In,Ga)Se-2 solar cells with an average E-g of 1.4 eV could be achieved. (C) 2015 The Japan Society of Applied Physics

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