Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3467468
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Funding
- Engineering and Physical Sciences Research Council (U.K.)
- Royal Society
- European Research Council, Office of Naval Research [N00014-08-1-0277]
- Air Force Office of Scientific Research [FA8655-08-1-3088]
- Evonik Stiftung (Germany)
- Engineering and Physical Sciences Research Council [EP/G035954/1] Funding Source: researchfish
- EPSRC [EP/G035954/1] Funding Source: UKRI
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In this letter, we show how high-resolution scanning tunneling microscopy (STM) imaging can be used to reveal that certain edges of micromechanically exfoliated single layer graphene crystals on silicon oxide follow either zigzag or armchair orientation. Using the cleavage technique, graphene flakes are obtained that very often show terminating edges seemingly following the crystallographic directions of the underlying honeycomb lattice. Performing atomic resolution STM-imaging on such flakes, we were able to directly prove this assumption. Raman imaging carried out on the same flakes further validated our findings. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3467468]
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