Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3488829
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- National Natural Science Foundation of China [50702036]
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Based on the analysis of the photocurrent behavior of Pt sandwiched Pb(Zr0.2Ti0.8)O-3 (PZT) films, the experimental evidence of top Pt/PZT interface layer thickness effect on the photocurrent is reported. It was well established before that the photocurrent of metal/ferroelectric film is attributed to the height of Schottky contact barrier. However, our results suggest that the photocurrent of Pt/PZT interface contact is determined not only by the barrier height but also by the interface layer thickness, namely, by the built-in electrical field at the interface layer. The mechanism behind such photocurrent phenomenon is proposed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3488829]
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