Journal
APPLIED PHYSICS LETTERS
Volume 96, Issue 11, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3327829
Keywords
annealing; current density; electrical conductivity; electron-hole recombination; graphene; scanning probe microscopy
Categories
Funding
- EU GRAND
- ERC grant NANOPOTS
- EPSRC [EP/G042357/1]
- Royal Society
- EPSRC [EP/G042357/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/G042357/1] Funding Source: researchfish
Ask authors/readers for more resources
We have used scanning gate microscopy to explore the local conductivity of a current-annealed graphene flake. A map of the local neutrality point (NP) after annealing at low current density exhibits micron-sized inhomogeneities. Broadening of the local e-h transition is also correlated with the inhomogeneity of the NP. Annealing at higher current density reduces the NP inhomogeneity, but we still observe some asymmetry in the e-h conduction. We attribute this to a hole-doped domain close to one of the metal contacts combined with underlying striations in the local NP.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available