Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 23, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3524226
Keywords
-
Categories
Funding
- DFG [GK 638, GK 1570]
Ask authors/readers for more resources
Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene's optical properties can be investigated. (C) 2010 American Institute of Physics. [doi:10.1063/1.3524226]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available