Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 15, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3481065
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Funding
- NSF [DMR-0907197, DMR 0603644]
- ARC
- DEST ISL
- UMD-NSF-MRSEC [DMR 0520471]
- ARO [W911NF-07-1-0410]
- NEDO
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We have investigated heteroepitaxial films of Sm-doped BiFeO3 with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron x-ray diffraction, carried out in a temperature range of 25 to 700 degrees C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO3-like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films exhibiting anisotropic misfit between film and substrate. Additionally, thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in thinner films. (c) 2010 American Institute of Physics. [doi:10.1063/1.3481065]
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