4.8 Article

Film morphology and thin film transistor performance of solution-processed oligothiophenes

Journal

CHEMISTRY OF MATERIALS
Volume 16, Issue 23, Pages 4783-4789

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/cm0496570

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The relationship between film morphology and thin film transistor (TFT) performance was investigated for two symmetrical alpha,omega-substituted sexithiophene derivatives containing thermally removable solubilizing groups. Solution deposition methods such as spin-coating, dip-casting, and inkjet-printing were optimized for solvent and annealing temperatures, and several substrate surface treatments were explored. The resulting thin films were characterized with AFM and the observed semiconductor performance was found to correlate with the morphology of the films, with the most crystalline films exhibiting the highest performance. Devices showed overall mobilities as high as 0.07 cm(2)/V s with on/off ratios > 10(8), which are among the highest reported values for oligothiophenes solution cast at room temperature.

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