Journal
APPLIED PHYSICS LETTERS
Volume 96, Issue 5, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3301620
Keywords
arrays; atomic force microscopy; contact resistance; electrical conductivity; electrodes; electroforming; nanostructured materials; nickel; nickel compounds
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Funding
- Korea government MEST [R0A-2008-000-20052-0, R31-2008-000-100570, 2008-02557, R112008-053-03002-0]
- Seoul R BD Program [WR090671]
- National Research Foundation of Korea [R0A-2008-000-20052-0, 2008-02557] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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We report resistive switching characteristics of single-crystalline Ni/NiO core/shell nanodisk arrays, in which the conducting filaments are highly localized on the surface of nanostructure. The local current distributions observed in such a single-grained nanodisk demonstrate that the contact area and the contact time between the conductive tip of conducting atomic force microscopy and the surface of nanodisk critically influence the voltage-stress-induced electroforming behaviors of nanofilaments in NiO switching nanoblocks. These contact parameters, such as the contact area and the contact time, are interpreted to the electrode size and the voltage-stress time for the formation of filaments in metal oxides.
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