Journal
APPLIED PHYSICS LETTERS
Volume 96, Issue 18, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3424792
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- Cambridge Integrated Knowledge Center (CIKC)
- Engineering and Physical Sciences Research Council (EPSRC)
- EPSRC [EP/E023614/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/E023614/1] Funding Source: researchfish
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We demonstrate efficient electron injection from a high work function metal in staggered transistors based on the high mobility poly{[N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'-bithiophene)}. Channel length scaling shows that the linear mobility for electrons remains higher than 0.1 cm(2)/V s when reducing the channel length to a few micrometers. Field-enhanced injection favors downscaling at a fixed lateral voltage and reduces the contact resistance to 11 k Omega cm at high gate voltages for channels of only a few micrometers. The contacts are asymmetric, with the source contribution dominating the overall resistance, consistent with an injection limited regime rather than bulk-limited as generally found in staggered transistors. (C) 2010 American Institute of Physics. [doi:10.1063/1.3424792]
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