Journal
APPLIED PHYSICS LETTERS
Volume 85, Issue 21, Pages 4929-4931Publisher
AMER INST PHYSICS
DOI: 10.1063/1.1825053
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A series of ZnO1-xSx films with 0less than or equal toxless than or equal to1.0 was deposited by radio-frequency reactive sputtering on different substrates. The structural characterization by x-ray diffraction measurements revealed that the films have wurtzite symmetry and correlated investigations of the layer composition by photoelectron spectroscopy showed that the lattice constant varies linearly with x. The composition dependence of the band gap energy in the ternary system was determined by optical transmission and the optical bowing parameter was found to be about 3 eV. (C) 2004 American Institute Of Physics.
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