Journal
APPLIED PHYSICS LETTERS
Volume 96, Issue 19, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3428369
Keywords
annealing; electron energy loss spectra; grain boundary diffusion; II-VI semiconductors; reaction kinetics; transmission electron microscopy; zinc compounds
Categories
Funding
- National Research Foundation of Korea (NRF)
- Ministry of Education, Science, and Technology [2009-0085412]
- National Research Foundation of Korea [2009-0085412] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
Ask authors/readers for more resources
Using a model ZnO bicrystal, we examine grain boundary kinetics by high-resolution transmission electron microscopy. The grain boundary undergoes a transition from atomically stepped to undulating appearances with increasing driving force for migration at a given temperature, producing clear evidence that grain boundaries undergo kinetic roughening.(C) 2010 American Institute of Physics. [doi:10.1063/1.3428369]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
