4.6 Article

Improved tunnel magnetoresistance of magnetic tunnel junctions with Heusler Co2FeAl0.5Si0.5 electrodes fabricated by molecular beam epitaxy

Journal

APPLIED PHYSICS LETTERS
Volume 94, Issue 16, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3116717

Keywords

aluminium alloys; annealing; cobalt alloys; ferromagnetic materials; iron alloys; magnesium compounds; magnetic epitaxial layers; magnetic multilayers; molecular beam epitaxial growth; silicon alloys; tunnelling magnetoresistance

Funding

  1. Industrial Technology Research
  2. New Energy and Industrial Technology Development Organization of Japan
  3. Shoeikagaku foundation

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The authors have developed a magnetic tunnel junction of Co2FeAl0.5Si0.5 electrodes and a MgO barrier fabricated by molecular beam epitaxy and observed that this device had a tunnel magnetoresistance ratio of 386% at approximately 300 K and 832% at 9 K. The lower Co2FeAl0.5Si0.5 electrode was annealed during and after deposition resulting in a highly ordered structure with small roughness. This highly ordered structure could be obtained by annealing treatment even at low temperatures. Furthermore, a weak temperature dependence of the tunnel magnetoresistance ratio was observed for the developed magnetic tunnel junction.

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