4.6 Article

Surface plasmon resonances of optical antenna atomic force microscope tips

Journal

APPLIED PHYSICS LETTERS
Volume 94, Issue 17, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3116145

Keywords

antennas; atomic force microscopy; focused ion beam technology; probes; red shift; surface plasmon resonance

Funding

  1. Microsystems Technology Office (MTO) of the Defense Advanced Research Projects Agency (DARPA)
  2. National Science Foundation (NSF)

Ask authors/readers for more resources

A method for fabricating optical antennas on atomic force microscope probes using focused ion beam modification is described. We numerically demonstrate that these optical antenna probes provide a large near field intensity enhancement when illuminated at their resonant wavelengths. We experimentally measure the plasmon resonant wavelengths of probes with various lengths. Both simulation and experiment indicate that the resonant wavelength redshifts with increasing antenna length. We anticipate that the optical antenna tips could be used for mapping the field distributions of nanophotonic devices or for high spatial resolution spectroscopy.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available