Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 19, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3133359
Keywords
Auger effect; band structure; carrier density; current density; density functional theory; electron-hole recombination; gallium compounds; III-V semiconductors; indium compounds; light emitting diodes; nonradiative transitions; perturbation theory; wide band gap semiconductors
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Funding
- DOE and Inlustra Technologies
- LLC [DE-FC26-07NT43228]
- NSF MRSEC Program [DMR05-20415]
- Deutsche Forschungsgemeinschaft
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We report Auger recombination rates for wurtzite InGaN calculated from first-principles density-functional and many-body-perturbation theory. Two different mechanisms are examined-inter- and intra-band recombination-that affect different parts of the emission spectrum. In the blue to green spectral region and at room temperature the Auger coefficient can be as large as 2x10(-30) cm(6) s(-1); in the infrared it is even larger. Since Auger recombination scales with the cubic power of the free-carrier concentration it becomes an important nonradiative loss mechanism at high current densities. Our results indicate that Auger recombination may be responsible for the loss of quantum efficiency that affects InGaN-based light emitters.
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