4.6 Article

Electrostatically defined few-electron double quantum dot in silicon

Journal

APPLIED PHYSICS LETTERS
Volume 94, Issue 17, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3124242

Keywords

CMOS integrated circuits; elemental semiconductors; resonant tunnelling devices; semiconductor quantum dots; silicon; single electron devices

Funding

  1. Australian Research Council
  2. Australian Government
  3. U.S. National Security Agency
  4. U.S. Army Research Office [W911NF-04-1-0290]

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A few-electron double quantum dot was fabricated using metal-oxide-semiconductor-compatible technology and low-temperature transport measurements were performed to study the energy spectrum of the device. The double dot structure is electrically tunable, enabling the interdot coupling to be adjusted over a wide range, as observed in the charge stability diagram. Resonant single-electron tunneling through ground and excited states of the double dot was clearly observed in bias spectroscopy measurements.

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