4.6 Article

Resistive switching characteristics in Pr0.7Ca0.3MnO3 thin films on LaNiO3-electrodized Si substrate

Journal

APPLIED PHYSICS LETTERS
Volume 94, Issue 17, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3126057

Keywords

calcium compounds; capacitors; lanthanum compounds; praseodymium compounds; random-access storage; space-charge-limited conduction; texture; thin films

Funding

  1. National Tsing-Hua University
  2. Taiwan Semiconductor Manufacturing Co. Limited, Republic of China

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The resistive switching characteristics of Pr0.7Ca0.3MnO3 (PCMO) thin films deposited on LaNiO3 (LNO)-electrodized Si substrate were investigated. Highly (100)-textured PCMO films were grown on the (100)-oriented LNO electrode. They exhibited reversible and steady bistable resistance switching behavior. The resistive switching behavior of PCMO capacitors on LNO is related to the trap-controlled space charge limited current mechanism and LNO/PCMO/LNO capacitor exhibits the strongest resistive switching effect with a resistance ratio for about two orders of magnitude.

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