Multilayer barrier films comprising nitrogen spacers between free-standing barrier layers

An encapsulation architecture for organic electronic devices utilizing nitrogen gas-phase spacers between free-standing barrier films is demonstrated. The nitrogen spacers act as sinks for permeating H(2)O and O(2), delaying establishment of steady-state chemical potential gradients across the barriers and thereby reducing permeation rates. Water vapor transmission through nitrogen-spaced barriers was measured via the calcium optical transmission test. Substantial reductions in permeation rate were observed for a variety of barrier materials and configurations, suggesting a general and cost-effective approach for improving encapsulation performance. A low-cost polyethylene terephthalate film increases the calcium lifetime of a Cytop T-Kureha structure from 7000 to 12000 min. (C) 2009 American Institute of Physics.