Journal
MATERIALS TODAY
Volume 7, Issue 12, Pages 50-55Publisher
ELSEVIER SCI LTD
DOI: 10.1016/S1369-7021(04)00571-1
Keywords
-
Categories
Ask authors/readers for more resources
The transmission electron microscope (TEM) is perhaps best known for forming images at the highest resolution. It has many other capabilities, of course, forming diffraction patterns or X-ray microanalysis to name but two, but the first item to be mentioned in an instrument's specification will probably be its resolution limit. In the last few decades, the performance of the TEM has improved slowly but steadily and the resolution limit has decreased from 1 nm to around 0.2 nm. Useful progress indeed, as many interatomic distances lie in the region of 0.2 nm.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available