Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 23, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3152766
Keywords
atomic force microscopy; cobalt compounds; ferromagnetic materials; iron compounds; magnetic hysteresis; magnetic thin films; paramagnetism; pulsed laser deposition; silicon; transmission electron microscopy; X-ray diffraction
Categories
Funding
- NSF MRSEC [DMR05-20020]
- NSF [DMR08-4376]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [0804376] Funding Source: National Science Foundation
Ask authors/readers for more resources
We report pulsed laser deposition synthesis and characterization of polycrystalline Fe1-xCoxSi thin films on Si (111). X-ray diffraction, transmission electron, and atomic force microscopies reveal films to be dense, very smooth, and single phase with a cubic B20 crystal structure. Ferromagnetism with significant magnetic hysteresis is found for all films including nominally pure FeSi films in contrast to the very weak paramagnetism of bulk FeSi. For Fe1-xCoxSi this signifies a change from helimagnetism in bulk, to ferromagnetism in thin films. These ferromagnetic thin films are promising as a magnetic-silicide/silicon system for polarized current production, manipulation, and detection.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
