4.6 Article

Determination of wurtzite InN/cubic In2O3 heterojunction band offset by x-ray photoelectron spectroscopy

Journal

APPLIED PHYSICS LETTERS
Volume 94, Issue 22, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3151956

Keywords

conduction bands; III-V semiconductors; indium compounds; semiconductor heterojunctions; semiconductor materials; valence bands; X-ray photoelectron spectra

Funding

  1. 863 High Technology R&D Program of China [2007AA03Z402, 2007AA03Z451]
  2. Special Funds for Major State Basic Research Project of China (973 program) [2006CB604907]
  3. National Science Foundation of China [60506002, 60776015]

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In2O3 is a promising partner of InN to form InN/In2O3 heterosystems. The valence band offset (VBO) of wurtzite InN/cubic In2O3 heterojunction is determined by x-ray photoemission spectroscopy. The valence band of In2O3 is found to be 1.47 +/- 0.11 eV below that of InN, and a type-I heterojunction with a conduction band offset (CBO) of 0.49-0.99 eV is found. The accurate determination of the VBO and CBO is important for use of InN/In2O3 based electronic devices.

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