Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 23, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3149706
Keywords
carrier mobility; EXAFS; fullerenes; polymer blends; polymer films; surface energy; XANES
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Funding
- NRC RAP
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The buried interface composition of polymer-fullerene blends is found by near-edge x-ray absorption fine structure spectroscopy to depend on the surface energy of the substrate upon which they are cast. The interface composition determines the type of charge transport measured with thin film transistors. These results have implications for organic photovoltaics device design and the use of transistors to evaluate bulk mobility in blends.
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